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High Power Array Semiconductor Laser

Industrial Pump Source Test System

Equipment Function

Power on high-power pump sources to test the output power, voltage, and current response curves of the LD chips within thepump sources, as wellas their spectral parameters, polarization, operating temperature, and NA of the output fiber

Product Details

  • Device motion XY-axis travel: 300 x 300mm,positioning accuracy up to 50 nm, and maximum speed
  • Testing time for single-chip pump LD light emission status and temperature:<20s
  • High-power integrating sphere capable of receiving up to 100 W of power
  • High-power water-cooled plate cooling with real-time monitoringof both the cooling plate and device temperature
  • Electric aperture used to test the NA of the pump output,NA includes energy Measurement error: ≤0.35%
  • Fiber optic 3D position recognition accuracy ≤±15um

Application Fields

  • optical fiber communication

  • fiber optic sensing

  • High power laser

  • Laser projection

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